70 entries, 1~16 shown
Card View
| Category Name | Manufacturer Name | Model Type | Year | Main Specifications | Location | Owner | ||
|---|---|---|---|---|---|---|---|---|
|
Tester | 高和 | ３R | 1971 | Osaka |
Kei-Machine Co.,Ltd.
|
Details | |
|
Tester | 戸越精機 | 1978 | Chiba Prefecture |
KA Machine Co., Ltd.
|
Details | ||
|
|
Tester | 戸越 | 不明 | 1981 | Osaka |
Kei-Machine Co.,Ltd.
|
Details | |
|
Tester | Shimadzu | HB | 1983 | Osaka Prefecture |
Kei-Machine Co.,Ltd.
|
Details | |
|
Tester | 松沢精機製作所 | MHT-1 | 1985 |
Maximum sample height 75mm, Maximum depth 105, Movement range 25*25, Eyepiece 10x40x, TV measurement device
|
Osaka |
Kei-Machine Co.,Ltd.
|
Details |
|
|
Tester | Akashi Seiisakusho | ARD-A | 1985 | Osaka |
Kei-Machine Co.,Ltd.
|
Details | |
|
Tester | Akashi Seiisakusho | ARK-F1000 | 1991 |
Reference dimensions: Height 255 Depth 145, Test load 60/100/150kgf
|
- |
Kei-Machine Co.,Ltd.
|
Details |
|
Tester | マツザワ | RXT-3 | 1992 |
Maximum sample height 200, maximum depth 150, digital printer MCP-2T
|
- |
Kei-Machine Co.,Ltd.
|
Details |
|
Tester | Akashi Seiisakusho | MVK-H100 | 2001 |
Maximum sample height 90 Maximum depth 100, Movement range: 25*25, T: 100*100, Close 10x, Opposite 10x, 40x, CCD camera, Monitor device
|
- |
Kei-Machine Co.,Ltd.
|
Details |
|
Tester | Akashi Seiisakusho | ARK-F2000 | 2004 |
○Main specifications Easy operation for material hardness testing Easy-to-use desktop Rockwell hardness tester Enter test conditions interactively Determine the height with the up and down handles, then operate with automatic motor drive. By setting the upper and lower limits, pass/fail judgment test inspection is easy. ○Sample size Maximum dimensions L145 x H255mm ○Hardness test Applicable C scale, B scale ○Test load Dial switching 60, 100, 150 kgf Load control Automatic = load, hold, unload Motor drive ○Device size Dimensions Width 220 x Depth 620 x Height 830 mm Weight Approximately 60 kg ○Accessories Flat round anvil φ65mm x 1 Indenter C scale x 1 B scale Not included
|
Ibaraki |
TOSHIN MACHINE TOOL CO.,LTD．
|
Details |
|
Tester | 東芝ITコントロールシステム | TOSMICRON-S4090FD | 2004 |
Input: AC100V, Sample table: 350 x 300, Stroke: X-axis 350mm x Y-axis 300mm★
|
Ibaraki Prefecture, |
TokyoEngineering
|
Details |
|
Tester | Akashi Seiisakusho | AR-10 | 2005 |
T200φ
|
- |
Kei-Machine Co.,Ltd.
|
Details |
|
Tester | 堀場製作所 | XGT-1000WR | 2006 |
Measurement elements: Si to U, Sample shape: Maximum 460mm x 360mm (height 150mm), X-ray irradiation diameter: φ1.2mm, Detection limit: Cd 2ppm, Pd 5ppm★
|
Ibaraki Prefecture, |
TokyoEngineering
|
Details |
|
Tester | マツザワ | MMT-X7 | 2008 | Osaka |
Kei-Machine Co.,Ltd.
|
Details | |
|
Tester | 仲井精機製作所 | D型 | 2009 |
Vertical 75mm, Plane range 62mm
|
- |
Kei-Machine Co.,Ltd.
|
Details |
|
Tester | Shimadzu | Unknown | Osaka Prefecture |
Kei-Machine Co.,Ltd.
|
Details |