70 entries, 65~70 shown
Card View
| Category Name | Manufacturer Name | Model Type | Year | Main Specifications | Location | Owner | ||
|---|---|---|---|---|---|---|---|---|
|
Tester | 日本高圧電気 | NPF01C-1001 | Unknown |
[Set contents] Measurement terminals, cable (remote switch), computer (with software), tape, etc. See photo. In the event of any discrepancies between the specifications and the actual product, the actual product will take precedence.
|
Mie Prefecture |
ShinMaywa Kiko
|
Details |
|
Tester | リガク | MJ10275A | Unknown |
Please see attached document★
|
Ibaraki Prefecture |
TokyoEngineering
|
Details |
|
Tester | 堀場製作所 | XGT-1000WR | 2006 |
Measurement elements: Si to U, Sample shape: Maximum 460mm x 360mm (height 150mm), X-ray irradiation diameter: φ1.2mm, Detection limit: Cd 2ppm, Pd 5ppm★
|
Ibaraki Prefecture, |
TokyoEngineering
|
Details |
|
Tester | 島津 | EDX-700 | Unknown |
Analyzable elements: Na to U, Sample shape: Max. φ300mm x 150mm (H)★
|
Ibaraki Prefecture, |
TokyoEngineering
|
Details |
|
Tester | 東芝ITコントロールシステム | TOSMICRON-S4090FD | 2004 |
Input: AC100V, Sample table: 350 x 300, Stroke: X-axis 350mm x Y-axis 300mm★
|
Ibaraki Prefecture, |
TokyoEngineering
|
Details |
|
Tester | CMI | CMI913 | Unknown |
S/N:00474★
|
Ibaraki Prefecture |
TokyoEngineering
|
Details |